The entries of “Technologies made in Vienna” are displayed in the project language.
Technologies from Vienna
Next Generation of Atomic Force Microscopy CantileversSCL-Sensor.Tech. Fabrication focuses on the improvement of next generation atomic force microscopy (AFM) cantilevers. Two types of this next generation AFM sensor probes are especially small & soft cantilevers for low noise and highly sensitive SPM imaging as well as piezoresistive self-sensing cantilevers for new AFM applications. These cantilevers are suited for use in tapping and contact AFM imaging mode. With self-sensing probes no laser is necessary and the space above the cantilever is freed up e.g. for use within a SEM.
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